Name |
Affiliation |
Country/Area |
Zili Wang |
Beihang University |
China |
Changhong Gu |
China Astronautics Standards Institute |
China |
Yunhui Wang |
China Electronic Product Reliability and Environmental Testing Research Institute |
China |
Wenhua Chen |
Zhejiang Sci-Tech University |
China |
Lirong Cui |
Qingdao University |
China |
Yunfei En |
China Electronic Product Reliability and Environmental Testing Research Institute |
China |
Hongzhong Huang |
University of Electronic Science and Technology of China |
China |
Guangzhen Ji |
China Ordnance Society Reliability Committee |
China |
Zhaojun Steven Li |
Western New England University |
USA |
Chen Lu |
Beihang University |
China |
Xiaobing Ma |
Beihang University |
China |
Michael Pecht |
University of Maryland |
USA |
Shousong Qing |
China Astronautics Standards Institute |
China |
Liming Ren |
China Astronautics Standards Institute |
China |
Tommaso Sgobba |
International Association for the Advancement of Space Safety |
Netherlands |
Carlos Guedes Soares |
University of Lisbon |
Portugal |
Wendai Wang |
Reliability and Maintainability Symposium |
USA |
Liyang Xie |
Northeastern University |
China |
Min Xie |
City University of Hong Kong |
Singapore |
Jianping Xu |
Shanghai Institute of Process Automation & Instrumentation Co.,Ltd |
China |
Chunhui Yang |
China Electronic Product Reliability and Environmental Testing Research Institute |
China |
Yu Zhao |
Beihang University |
China |
Enrico Zio |
Polytechnic University of Milan |
Italy |
Mingjian Zuo |
University of Alberta |
Canada |